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EMF and SEM-TEM Microscopes
 SEM (Scanning Electron) Microscope SEM – Scanning electron microscopeWith SEM, a focused beam of high-energy electrons is scanned over the surface of a material. The electron beam interacts with the material, causing a variety of signals—secondary electrons, backscattered electrons, X-rays, photons, etc.—each of which may be used to characterize a material with respect to specific properties. The signals are used to modulate the brightness on a display CRT, thereby providing a high-resolution map of the selected material property.Because electron beams are easily bent by magnetic fields, these microscopes are very susceptible to disturbance—from external AC magnetic fields of as low as 2 or 3 mG.
 TEM (Transmission Electron) Microscope TEM – Transmission electron microscopeWith transmission electron microscopy (TEM), a thin (<200 nm) sample is bombarded by a highly focused beam of single-energy electrons. The beam has enough energy for the electrons to be transmitted through the sample. The transmitted electron signal is greatly magnified by a series of electromagnetic lenses. The magnified transmitted signal may be observed in two ways, through electron diffraction or direct electron imaging.TEM microscopes are very high resolution and are extremely sensitive to external interference from AC magnetic fields. They can exhibit disturbance from external AC magnetic fields of as little as 0.1 mG. These microscopes are critical to leading edge research in the semi-conductor and emerging nanotechnology technologies. Due to extreme sensitivity requirements, very close attention must be given to the design and construction of rooms which house these microscope systems to insure that EMI threat conditions are not present. FMS has extensive experience in providing project designers and architects with guidance and assessment services to insure that the stringent EMI environmental requirements can be met. |
SEARCHSearch the entire FMS web site to find exactly the information you want to know:Industry ExperienceHaving performed hundreds of major shielding installations and more than a thousand field surveys, FMS delivers innovation tempered with experience. Just take a look at our list of satisfied clients.Commitment to ExcellenceFMS has been eliminating electromagnetic interference issues in commercial & industrial buildings, medical facilities, and research laboratories for over ten years. Using the latest technology, backed by independent research and development, FMS delivers customized, innovative solutions for the most complex interference problems, worldwide. | |||||
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