Nanotechnology, EMF/EMI, and SEM, TEM, and STEM Microscopes

Nanotechnology applications in materials or biological science require instruments at the leading edge of imaging: SEM, TEM and STEM EMs. Whether in designing a research facility, a fabrication plant or hospital, it is also these instruments and their requirements for extremely quiet environments that cause facility designers to include an expert on EMF sources and mitigation on the design team. FMS has a long history of successfully creating ultra-quiet environments which meet the demanding EMI specifications of these types of instruments. FMS provides site analysis, facility analysis and field mitigation design and implementation, including passive and active EMF/EMI shielding. Through the restrained use of EMF/EMI field mitigation techniques, FMS is the leader in cost effective, 100% compliant EMI solutions for these sensitive environments.

SEM (Scanning Electron) Microscope

SEM – Scanning electron microscope

With an SEM, a focused beam of high-energy electrons is scanned over the surface of a material. The electron beam interacts with the material, causing a variety of signals—secondary electrons, backscattered electrons, X-rays, photons, etc.—each of which may be used to characterize a material with respect to specific properties. The signals are used to modulate the brightness on a display CRT, thereby providing a high-resolution map of the selected material property.

Because electron beams are easily bent by magnetic fields, these microscopes are very susceptible to electromagnetic disturbance—from stray AC and Quasi-DC magnetic fields at extremely low levels.

TEM (Transmission Electron) Microscope

TEM – Transmission electron microscope

TEM microscopes are very high resolution and are extremely sensitive to external interference from stray AC and Quasi-DC magnetic fields. They can exhibit disturbance from external AC magnetic fields of as little as 0.1 mG.

These microscopes are critical to leading edge research in the semi-conductor and emerging nanotechnology technology industries. Due to extreme sensitivity requirements, very close attention must be given to the design and construction of rooms which house these microscope systems to ensure that EMI threat conditions are not present. FMS has extensive experience in providing project designers and architects with guidance and assessment services to insure that the stringent EMI environmental requirements can be met.